Home/Produkti/MAHR MarSurf GD 280 Roughness measuring station

MAHR MarSurf GD 280 Roughness measuring station

MarSurf GD: The new reference measuring station for roughness and waviness measurements

The new Mahr measuring stations from the MarSurf GD series are setting new standards.In addition to surface roughness evaluations, profile, and waviness evaluations can also be performed. The new MarSurf GD series is enabling production companies to achieve a new dimension to reliably ensure and improve the production quality of workpieces in the measuring room or close to the production area.

The new measuring station concept combines speed, security, and flexibility. The aim is to increase the cost-effectiveness of the system for your company.

The measuring stations are operated with the user-friendly MarWin software (MarWin EasyRoughness or MarWin ProfessionalRoughness).

Ask a question

Description Iespējas Specification Video

MarSurf GD 280 Roughness measuring station

Innovative technologies:

Fast axes

Positioning speeds up to 200 mm/s in X
40 x faster than its predecessor MarSurf GD 120
The Z-axis is fully CNC-capable by default
The Z-axis is approx. twice as fast as previous Mahr Z-axes
Up to 5 times faster than standard Z-axes on the market
Contacting and zeroing via the Z-axis

New flexible probe system mount with BFW probe system

Simple probe arm change and probe arm protection by means of magnetic probe arm holder
Probe arm holder allows the change from standard to transverse measurement without tools or adapters
Extensions for the touch probe are possible

Innovative workpiece clamping system

Mounting plate 390 x 430 mm with bore dimension 50 mm
Integrated 60 mm TY adjustment
The combination of mounting plate and integrated TY adjustment makes an additional XY table superfluous
Low workpiece setup supports a favorable short measurement loop, which has a positive effect on the measurement results

	MarSurf GD 280	MarSurf GD 140
Resolution	Measuring range 1: 7.6 nm Measuring range 2: 0.76 nm	Measuring range 1: 7.6 nm Measuring range 2: 0.76 nm
Start of traversing length (in X)	0 mm	0 mm
Probe arm length	45 mm (x 1) 67.5 mm (x 1,5) 90 mm (x 2) 112.5 mm (x 2,5) 135 mm (x 3)	45 mm (x 1) 67.5 mm (x 1,5) 90 mm (x 2) 112.5 mm (x 2,5) 135 mm (x 3)
End of traversing length (in X)	280 mm	140 mm
Positioning speed	0.02 – 200 mm/s (in X)	0.02 – 200 mm/s (in X)
Guide deviation	0.07 µm / 20 mm 0.2 µm /  60 mm 0.4 µm / 140 mm	0.07 µm / 20 mm 0.2 µm /  60 mm 0.4 µm / 140 mm
Measuring speed	Up to 10 mm/s	Up to 10 mm/s
Measuring range mm	500 µm (±250 µm) for probe arm length 45 mm 1500 µm (±750 µm) for probe arm length 135 mm	500 µm (±250 µm) for probe arm length 45 mm 1500 µm (±750 µm) for probe arm length 135 mm