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Helmut-Fischer FISCHERSCOPE® X-RAY XDAL®-PCB

Universal XRF instrument for measuring small structures, multilayer coatings, functional coatings and thin coatings < 0.1 µm.

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Description Features Applications

XRF PCB testing for professionals.

The combination of a powerful silicon drift detector, multi-aperture and changeable filters makes FISCHERSCOPE® X-RAY XDAL®-PCB instruments a perfect solution for measuring small structures on PCBs.

Commissioning.

Extremely fast and simple

PCB experts.

Specialized measuring solutions for printed circuit boards, fulfill IPC standards

Programmable.

Automated measurements on predefined structures thanks to advanced pattern recognition technology

Meeting all challenges.

Reliable and fast results for ambitious measuring tasks

Fully automatable.

Let your instrument work for you

Microfocus tube with tungsten anode
Fixed, wide measuring table for PCBs up to 610 × 610 mm, optionally with measuring table extension 1200 x 900 mm or in automated version, depending on device
Measuring spot approx.: Ø 0.2 mm
4-fold changeable apertures and 3-fold changeable filters
Up to 10 mm possible height of samples
Large silicon drift detector for highest precision on thin layers

Measuring on smallest components and structures on PCBs up to 610 x 610 mm (24 x 24 in)
Measuring functional coatings in the electronics and semiconductor industry
Analysis of very thin coatings of ≤ 0.1 μm
Determination of lead content in solders
Determination of complex multilayer systems
Direct phosphorus determination of NiP coatings
Meets ENIG/ENEPIG requirements

Helmut-Fischer FISCHERSCOPE® X-RAY XDAL®-PCB