Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts, wires or smaller circuit boards as well as for the determination of the metal content of electroplating baths and the composition of simple alloy layers.
The FISCHERSCOPE® X-RAY XULM®/XUL® instruments are compact, versatile XRF measuring devices ideal for non-destructive coating thickness measurement and material analysis. With an integrated proportional counter tube detector, they allow fast measurements, especially with large measuring distances and complex shaped samples, even with small measuring spots. These and numerous other functions make these devices indispensable tools in the areas of quality assurance, incoming goods inspection and production monitoring, especially in electroplating.
Largest measurement window on the market
The sample is placed and ready for measurement in just a few steps
Hood with C-slot allows large, flat samples
Extremely fast and simple
Optimal cost-benefit ratio
Even with large-area samples, measuring points are possible over the entire sample area
