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Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-µ LD

Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-µ LD
Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-µ LD

Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-µ LD

Mastering demanding measuring tasks with polycapillaries: High-end XRF measuring device with polycapillary X-ray optics for measuring on the smallest components with smallest measuring spot and largest measuring distance.

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Description Features Applications

Performance at its best.

The high point for complex shaped small test parts. The FISCHERSCOPE® X-RAY XDV®-μ LD brings unparalleled measuring distance combined with the smallest measuring spot and microfocus tube Ultra for higher performance with smallest measuring sports, making it the industry-leading XRF instrument.

  • Meeting all challenges.

Reliable and fast results for ambitious measuring tasks

  • Fully automatable.

Let your device work for you with just one click

  • Most advanced polycapillary optics on the market.

Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times

  • Programmable.

Automated measurements on predefined structures thanks to advanced pattern recognition technology

  • DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*
*compared to the DPP

  • Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots; Molybdenum anode optional
  • Changeable filter
  • Higher count rates and significantly reduced measurement times thanks to DPP+
  • Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
  • Measuring spot approx.: Ø 35 µm
  • Determination of metal content in electroplating baths with corresponding accessories
  • Silicon drift detector with 20 or 50 mm² active area for highest precision with thin layers
  • Up to 135 mm possible height of samples
  • Measuring on smallest components and structures like assembled and complex shaped PCBs, plug contacts, bonding areas, SMD components or thin wires
  • Measuring of functional layers in the electronics and semiconductor industry
  • Determination of complex multilayer systems
  • Automated measuring, such as in quality control