Universal XRF instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
Equipped with a microfocus tube, multiple aperture and primary filter changer, the XDLM® series is the best choice to inspect many small parts one after the other. The instruments are closely related to the XULM® series, with only one significant difference: measuring direction from top down! This means convenient analysis of uneven samples as well as the possibility of automated measuring – and therefore predestined for quality assurance, incoming goods inspection and production monitoring. As a special solution for PCBs, the device is available as XDLM® PCB.
Extremely fast and simple
Different models offer the optimal solution for your application
Even with large samples, measuring points are possible on the entire sample surface
Hood with C-slot
Robust design for measurement on mass parts
The sample is placed and ready for measurement in just a few steps
