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Helmut-Fischer FISCHERSCOPE® X-RAY XAN®

Helmut-Fischer FISCHERSCOPE® X-RAY XAN®
Helmut-Fischer FISCHERSCOPE® X-RAY XAN® gallery
Helmut-Fischer FISCHERSCOPE® X-RAY XAN® gallery
Helmut-Fischer FISCHERSCOPE® X-RAY XAN®
Helmut-Fischer FISCHERSCOPE® X-RAY XAN® gallery
Helmut-Fischer FISCHERSCOPE® X-RAY XAN® gallery

Helmut-Fischer FISCHERSCOPE® X-RAY XAN®

Universal instrument for metal and precious metal analysis as well as measuring coating thickness on simple shaped samples and RoHS screening.

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Description Features Applications

The right XRF device for every application.

Whether PIN detector, silicon drift detector, fixed sample support or manually operated XY-table: The FISCHERSCOPE® X-RAY XAN® offers versatile application support and is adaptable to your specific needs. This enables precise material analysis of precious metal and gold alloys, coating thickness measurement or trace analysis. The instrument version with the 50 mm² silicon drift detector is also suitable for RoHS measuring.

  • Versatile.

For trade, industry and laboratory applications

  • Quick-measure design.

The sample is placed and ready for measurement in just a few steps

  • Commissioning.

Extremely fast and simple

  • RoHS analysis.

Reliable determination of hazardous substances

  • DPP+ digital pulse processor*.

Even shorter measuring times with the same standard deviation**

*not with FISCHERSCOPE® X-RAY XAN® 215
**compared to the DPP

  • Microfocus tube with tungsten anode
  • Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution
  • Higher count rates and significantly reduced measurement times thanks to DPP+
  • Larger hood: From 90 up to 170 mm possible height of samples, depending on device
  • Apertures: fixed or 4-fold changeable*, Primary filters: fixed or 6-fold changeable*(*depending on device)
  • Type approved full protection device
  • Smallest measuring spot approx.: Ø 0.3 mm
  • Determination of metal content in electroplating baths with corresponding accessories
  • Non-destructive analysis of dental alloys
  • Multilayer coatings
  • Analysis of functional layers from 10 nm in the electronics and semiconductor industry
  • Trace analyses for consumer protection, such as lead content in toys
  • Metal alloy determination with highest accuracy requirements in the jewelry industry and refineries