Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
Designed for maximum uptime, the FISCHERSCOPE® X-RAY 5000 series is convincing with its high degree of customization and outstanding measurement performance – non-contact, non-destructive, and precise. The devices of this series form modular units, which is why they can be easily installed as pure components within an existing plant.
Easy integration, individually adaptable to your application
Sample temperatures up to 250 °C (482 °F) thanks to water cooling
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
No moving parts
Measuring head with all necessary components in one unit
Can be mounted on vacuum chambers