Helmut-Fischer FISCHERSCOPE® X-RAY 5000

Helmut-Fischer FISCHERSCOPE® X-RAY 5000

Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.

 

Continuous and smart quality control.

Designed for maximum uptime, the FISCHERSCOPE® X-RAY 5000 series is convincing with its high degree of customization and outstanding measurement performance – non-contact, non-destructive, and precise. The devices of this series form modular units, which is why they can be easily installed as pure components within an existing plant.

    • Tailor-made.

Easy integration, individually adaptable to your application

    • Does not break a sweat.

Sample temperatures up to 250 °C (482 °F) thanks to water cooling

    • DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*
*compared to the DPP

    • Robust and reliable.

No moving parts

    • Compact design.

Measuring head with all necessary components in one unit

    • Vacuum compatible.

Can be mounted on vacuum chambers

  • Microfocus tube with tungsten anode; molybdenum anode optional
  • Fixed aperture (configurable up to Ø 11 mm)
  • For measuring in vacuum or in the air
  • Optionally with water cooling for sample temperatures up to 250 °C
  • Silicon drift detector 50 mm² for highest precision
  • Fixed filter (configurable)
  • Peltier cooling
  • Higher count rates and significantly reduced measurement times thanks to DPP+
  • Any installation position possible
  • Remote control and data export via TCP/IP interface
  • Measuring thin coatings and low loadings on large-area products and substrates, such as fuel cells, on glass panels and very hot surfaces
  • Monitoring the composition and thickness of layers in photovoltaics such as CIGS, CIS, CdTe and CdS
  • Measuring thin layers of a few µm on metal strips, metal foils and plastic films
  • Process monitoring of sputtering and electroplating equipment